The Next Metrology Tool for Wide Areas
The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high resolution measuring instrument. Extremely easy-to-use with one button acquisition.
- Large Area 3D optical Metrology System
- Sub-micron height repeatability over entire extended area
- One shot height measurement up to 40 mm without Z scanning
- Bi-telecentric lenses with very low field distortion providing accurate metrology
- Traceability: Every S wide is manufactured to deliver accurate and traceable measurements. Systems are calibrated using traceable standards according to ISO 25178 and VDI 2634-2.
3D Optical Profiler
The new S neox outperforms existing optical 3D profiling microscopes in terms of performance, functionality, efficiency and design, providing Sensofar with a class-leading areal measurement system.
The S neox is a complete tool. Its design is ideal for obtaining a fast, noninvasive assessment of the micro- and nanogeometry of technical surfaces in multiple configurations. S neox provides the flexibility, durability and efficiency required from the standard setup for R&D and quality inspection laboratories to sophisticated, customized solutions for online process controls, measuring samples up to 300×300 mm2 and maximum height up to 350 mm.
S neox Five Axis
Complete 3D Measurement Solution
The S neox Five Axis 3D Optical profiler combines a high-accuracy rotational module with the advanced inspection and analysis capabilities of the S neox 3D Optical profiler. This enables automatic 3D surface measurements at defined positions which can be combined to create a complete 3D volumetric measurement. S neox 3D measurement technologies cover a wide range of scales, including form (Ai Focus Variation), sub nanometric roughness (Interferometry) or critical dimensions that require high lateral resolution as well as vertical resolution (Confocal).
The Five Axis system makes it possible to take automatic 3D surface measurements at defined positions, and combine them to create a complete 3D volumetric measurement or to inspect the surface finish at specific positions around the sample.
Compact 3D Surface Profiler
S lynx is a new non-contact 3D surface profiler designed for use in industry and research. It has been designed as a compact and versatile system. S lynx is able to measure differing textures, structures, roughness and waviness, all across varying surface scales. The S lynx’s versatility makes it appropriate for a broad range of high-end surface measurement applications. Ideal performance is guaranteed by Sensofar’s proprietary 3-in-1 measurement technology, and complemented by the incredibly intuitive operation of the system with the associated SensoSCAN software.
S mart & S onix
In-line 3D Surface Sensors
Our two in-line systems have primarily been designed to be compact, robust and easily integrated. The next priority was to align their specific strengths to those performance characteristics that are actually required in a production environment.
The S mart addresses the need for ultimate measurement flexibility in an in-line capable package, and is positioned as the most versatile industrial system on the market.
The S onix addresses the need for outright high speed – and thus high throughput – surface metrology in in-line production and process control, and is positioned as the fastest industrial system available today.